CMM Qualification Tools: The Making-Of
What makes the CMM qualification tools so special? Jay wants to know more about it and meets up with Helena Zizer. She gives Jay an insight into the making of a CMM Qualification Tool and guides Jay through the individual steps.
![]({"small":"https://images.zeiss.com/metrology/products/accessories/cmm/pallets-and-vice/vice.ts-1530082644694.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=0a9283a43aa072d7bcaf590b11bda9b3","large":"https://images.zeiss.com/metrology/products/accessories/cmm/pallets-and-vice/vice.ts-1530082644694.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=1161eef5f21c35cf2a422ba222c50144","medium":"https://images.zeiss.com/metrology/products/accessories/cmm/pallets-and-vice/vice.ts-1530082644694.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=77b2f0b02cee14ca9d02fc092552ece6","full":"https://images.zeiss.com/metrology/products/accessories/cmm/pallets-and-vice/vice.ts-1530082644694.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=e55e239c433e0fa63f5721f514cf4011"} "ZEISS Vice for clamping workpieces")
![]({"small":"https://images.zeiss.com/metrology/products/accessories/probes/diamondscan/diamondscan-stylus.ts-1529905701623.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C1920%2C1920&w=640&s=f40782122bd05b67f9799064a9828cc5","large":"https://images.zeiss.com/metrology/products/accessories/probes/diamondscan/diamondscan-stylus.ts-1529905701623.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C1920%2C1920&w=1280&s=4a8594cbccb01d72941e9898799ba5ad","medium":"https://images.zeiss.com/metrology/products/accessories/probes/diamondscan/diamondscan-stylus.ts-1529905701623.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C1920%2C1920&w=832&s=5a0ea28eaba010af0e73dbc25c44e571","full":"https://images.zeiss.com/metrology/products/accessories/probes/diamondscan/diamondscan-stylus.ts-1529905701623.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C1920%2C1920&w=1920&s=a24bdb1b3de841822485f33670204116"} "ZEISS Diamond!Scan")
![]({"small":"https://images.zeiss.com/metrology/products/accessories/measuring-room/tempar/tempar.ts-1520494479017.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=659e3d32aedf2796e8c2acdbd4a016ca","large":"https://images.zeiss.com/metrology/products/accessories/measuring-room/tempar/tempar.ts-1520494479017.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=a64ea2662ae3fc6833fedda85ca77e16","medium":"https://images.zeiss.com/metrology/products/accessories/measuring-room/tempar/tempar.ts-1520494479017.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=168ba3da134d07dd2d3ff15bae884f27","full":"https://images.zeiss.com/metrology/products/accessories/measuring-room/tempar/tempar.ts-1520494479017.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=aeff7ba7880d94e84f53fc31f65224de"} "ZEISS TEMPAR monitoring measuring lab")